| Item Name | Semiconductor Device Diode |
| Federal Supply Group (FSG) | Electrical and Electronic Equipment Components |
| Federal Supply Class (FSC) | 5961 Semiconductor Devices and Associated Hardware |
| National Item Identification Number (NIIN) | 00-855-7224 (008557224) |
| NCB Code | USA (00) |
| Manufacturer | Military Specifications, Lockheed Martin Corporation, Thales Nederland Bv, Underwriters Laboratories Inc, Northrop Grumman Space And Mission Systems Corp, The Boeing Company |
| Part Number | Manufacturer | Item Name | Cage Code | RFQ |
|---|---|---|---|---|
| USA1N1616 | military specifications | semiconductor device diode | 81349 | RFQ |
| 928631-103 | lockheed martin corporation | semiconductor device diode | 98897 | RFQ |
| 1N1616 | military specifications | semiconductor device diode | 81349 | RFQ |
| 352250009992 | thales nederland bv | semiconductor device diode | h0203 | RFQ |
| USA1N1616 | underwriters laboratories inc | semiconductor device diode | 81345 | RFQ |
| VBE890-1N1616 | thales nederland bv | semiconductor device diode | h0203 | RFQ |
| 800030 | northrop grumman space and mission systems corp | semiconductor device diode | 11982 | RFQ |
| MIL-PRF-19500/162 | military specifications | semiconductor device diode | 81349 | RFQ |
| MIL-S-19500/162 | military specifications | semiconductor device diode | 81349 | RFQ |
| JAN1N1616 | military specifications | semiconductor device diode | 81349 | RFQ |
| BACD2B204 | the boeing company | semiconductor device diode | 81205 | RFQ |
| MRC | Criteria | Characteristic |
|---|---|---|
| ABHP | OVERALL LENGTH | 0.405 INCHES MAXIMUM |
| AXGY | MOUNTING METHOD | THREADED STUD |
| TEST | TEST DATA DOCUMENT | 81349-MIL-S-19500 SPECIFICATION (INCLUDES ENGINEERING TYPE BULLETINS,BROCHURES,ETC.,THAT REFLECT SPECIFICATION TYPE DATA IN SPECIFICATION FORMAT; EXCLUDES COMMERCIAL CATALOGS,INDUSTRY DIRECTORIES,AND SIMILAR TRADE PUBLICATIONS,REFLECTI |
| THSD | THREAD SERIES DESIGNATOR | UNF |
| TTQY | TERMINAL TYPE AND QUANTITY | 1 TAB,SOLDER LUG AND 1 THREADED STUD |
| ZZZK | SPECIFICATION/STANDARD DATA | 81349-MIL-S-19500/162 GOVERNMENT SPECIFICATION |
| AKPV | MOUNTING FACILITY QUANTITY | 1 |
| CBBL | FEATURES PROVIDED | HERMETICALLY SEALED CASE |
| CQJX | NOMINAL THREAD SIZE | 0.190 INCHES |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 720.0 MAXIMUM REVERSE VOLTAGE,INSTANTANEOUS |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 15.00 AMPERES MAXIMUM FORWARD CURRENT,DC |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | 150.0 DEG CELSIUS CASE |
| MATT | MATERIAL | SILICON SEMICONDUCTOR |
| Relevant Components for NSN - 5961-00-855-7224, 5961008557224 | ||||
| 5975-01-629-6429 (5975016296429) | 5998-01-305-2341 (5998013052341) | 5930-01-584-0809 (5930015840809) | 5962-01-210-3065 (5962012103065) | |
| 5905-00-175-4284 (5905001754284) | 5950-01-458-0903 (5950014580903) | 5920-01-490-0904 (5920014900904) | 5998-01-475-9891 (5998014759891) | |
| 5995-01-575-7529 (5995015757529) | 5962-01-310-7304 (5962013107304) | 5935-01-240-1468 (5935012401468) | 5995-01-374-0247 (5995013740247) | |
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